MPP Neo

IV, TPV, TPC, CE, (Photo-)CELIV - Semiconductor characterization for thin film solar cells

Applications

  • Full compatibility to ISOS test protocols for perovskite and organic solar cells
  • Aging in selectable electrical conditions: MPP, jSC and VOC
  • Accurate control of illumination, atmosphere and temperature
  • Degradation studies need statistics – degrade many devices at once

Functions

  • Fully automated stability tests
  • Up to 96 measurement channels per base unit, many base units can be combined
  • Every channel can be configured individually
  • 1 sun LED or metal halide lamp illumination
  • Temperature controlled with electrical heaters or water cooling

 

 

Key features

  • Every channel between +/- 3.5 V / 100 mA with a resolution of < 10 µV / 100 nA, MPP mode with selectable tracking algorithm or fixed parameter: jsc, Voc, defined voltage
  • Selectable MPP tracking algorithm
  • Base system configured with a web based graphical user interface
  • Storing data to a network location or preconfigured NAS
  • Illumination with white LEDs, metal halide lamps, LEDs with selectable wavelengths
  • Environmental chambers for aging in controlled atmosphere e. g. nitrogen or dry air
  • Temperature control unit for each environmental chambers to degrade at elevated temperatures or with constant water cooling

 

Download Data Sheet

See also

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MPP Options
Art.No. Description

MPPbase

Degradation base system • 19 inch rack format case • Browser based graphical user interface • Ethernet connection to store measurement data in a network location • 12 slots for measurement cards (up to 96 measurement channels) • Multiple base systems can be used together

MPP8

8 channel measurement card • Up to 12 per MPPbase • Each measurement channel can be configured for different degradation modes individually: jsc, Voc, set bias or MPP tracking • MPP tracking modes can be selected for each channel individually • Regular jV sweeps can be configured for each channel • Source range: +/- 3.5 V / 100 mA • Measurement range: +/- 3.5 V / 100 mA, resolution < 10 µV / 100 nA • Two measurement channels for temperature and irradiation sensors
SH3x3 Sample holder for 3x3 1-inch substrates with up to 8 contacts each incl. a temperature and an irradiation sensor
CustomSH Design of sample holder for custom substrate layouts (Only applies to first order) • Up to 8 cells per substrate
EC3x3 Environmental chamber for sample holders without glass cover • Hermetically sealable chamber made from Aluminum • 2 Valves for connection to a gas supply (low pressure) • Loadable in a Glovebox, fits in a “standard” small antechamber (150 mm diameter) • Electric feedthroughs • Prepared for sample temperature control
wLED for EC3x3 White LED illumination for EC3x3 • Array with 9 LEDs, 1 for each substrate in the EC3x3 • Up to 1 sun intensity • Intensity controlled by variable distance between LED and substrate • Active air cooling
MH for EC3x3 Metal halide lamp illumination for EC3x3 • Metal halide lamp with reflector to achieve homogeneous illumination • Up to 1 sun intensity • Intensity controlled by variable distance between lamp and substrate • Active air cooling
eTC for EC3x3 Electrical temperature control unit for EC3x3 • Heated ground plate for EC3x3 • Temperature controller • Up to 80 °C • PT100 for temperature control can be installed in EC3x3 close to the samples
wTC for EC3x3 Water-based temperature control unit for EC3x3 • Heated ground plate for EC3x3 • PT100 for temperature control can be installed in EC3x3 close to the samples
NAS Network attached storage for measurement data • 2x4 TB hard drives in RAID 1 mode • Preconfigured for plug and play

 


Contact

+49 (0)9131 6055 684 info@automatic-research.de